Advanced PDK Verification Platform
An automated QA software for PDKs, featuring a multitude of qualification mechanisms of PDK integrity, including technology files, PCell CDF and PCell physical verification (DRC & LVS)
PQLab supports PDK verification for planar process (0.18um to 22nm) and FinFET process (16nm to 5nm), covering applications in digital logic, analog, high voltage, and RF circuits. PQLab helps foundries
PDK engineers ensure PDK quality, enabling IC designers to easily analyze and qualify foundry PDKs and benchmark between different PDK versions and design flows
Supports planar process and
FinFET process
Supports PDK format and EDA tools
of mainstream Foundries
Supports PCell validation flows, full coverage of QA patterns, combinations of models/LVS/PEX formats
Built-in pattern generation module
for each PDK component
Supports test pattern
user customization
Existing PDK QA settings
reusable for future projects
PDK QA Pattern
automatic generation
PDK parallel
QA verification
Multi-version PDK
cross check
iPDK
QA verification
The COT department of a leading Fabless company incorporated the PQLab to verify their in-house extended PDKs by generating test patterns in batches, quickly and precisely identifying PDK quality issues, accelerating delivery efficiency, providing more reliable PDKs for circuit design, and significantly saving design verification time.
A leading Fab integrated PQLab as its preferred verification tool for PDK development, replacing their original internal script verification process. The tool's one-click PDK import feature and embedded multiple verification mechanisms automatically generate batches of test patterns, helping engineers quickly identify defects of PCell and accurately locate them through clear reports. By adopting a unified tool platform, the customer minimized the need for extensive engineer verification experience, mitigating the impact of individual engineer capabilities. This led to a substantial improvement in both the efficiency and quality of PDK verification overall.