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LabExpress

Flexible Electrical Parameter Testing Software

Parametric Testing Automated Testing Data Analysis and Management

LabExpress Electrical Parameter Testing Software is a professional tool designed for electrical parameter test applications across research, development and production of semiconductor devices.

  • Supports completing complex setting in one step and acquiring all device information in one glance with Intuitive GUI; Supports data figures to overlap and compare conveniently with multi-window data display

  • Supports Primarius test instruments with full functionalities, mainstream probe stations, switch matrix and 3rd party instruments to perform automated testing

  • Support complete parameter test applications with ready-to-use testing algorithm library, such as DC, pulse, CV, transient IV, arbitrary waveform generation, noise, RF parameter tests

  • Supports powerful data analysis, such as real-time data processing, overlay analysis, transformation of test analysis graph images with one-click, and capable of distance, slope and correlation coefficient measurements on the graph images directly

  • Supports wafer-level mass data management, including wafer mapping, test plan setup efficiently, tests database auto-save and wafer-level data recall at any time

  • Support custom test algorithms, flexible test processes and complex mathematical calculations and analysis with built-in script programing platform

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Highlights

  • Easy-To-Use

    Intuitive GUI for
    convenient viewing & processing
    of test applications

  • Versatile Applications

    Complete DUT types
    and rich ready-to-use
    test applications library

  • Powerful Capabilities

    Support Primarius test instruments
    with full functionalities, mainstream
    probe stations, switch matrix
    and 3rd party test instruments

  • Data Analysis

    Real-time multitasking data analysis,
    one-click transformation of
    graph images, and capable
    of distances, slopes, and
    correlation coefficients measurements
    on the graph images directly

  • Wafer-Level Testing

    Wafer-level measurement setup,
    execution, analysis and
    data management

  • Custom Extension

    Support custom test algorithms,
    flexible test processes and
    complex mathematical analysis with
    customizable script programming platform

Applications

  • Wafer-Level
    Electrical Parameter
    Testing

  • Model Electrical
    Characteristic Curve
    Testing

  • Wafer Level
    Reliability
    Testing

  • Various
    Mass Production
    Testing

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