Flexible Electrical Parameter Testing Software
Supports completing complex setting in one step and acquiring all device information in one glance with Intuitive GUI; Supports data figures to overlap and compare conveniently with multi-window data display
Supports Primarius test instruments with full functionalities, mainstream probe stations, switch matrix and 3rd party instruments to perform automated testing
Support complete parameter test applications with ready-to-use testing algorithm library, such as DC, pulse, CV, transient IV, arbitrary waveform generation, noise, RF parameter tests
Supports powerful data analysis, such as real-time data processing, overlay analysis, transformation of test analysis graph images with one-click, and capable of distance, slope and correlation coefficient measurements on the graph images directly
Supports wafer-level mass data management, including wafer mapping, test plan setup efficiently, tests database auto-save and wafer-level data recall at any time
Support custom test algorithms, flexible test processes and complex mathematical calculations and analysis with built-in script programing platform
Intuitive GUI for
convenient viewing & processing
of test applications
Complete DUT types
and rich ready-to-use
test applications library
Support Primarius test instruments
with full functionalities, mainstream
probe stations, switch matrix
and 3rd party test instruments
Real-time multitasking data analysis,
one-click transformation of
graph images, and capable
of distances, slopes, and
correlation coefficients measurements
on the graph images directly
Wafer-level measurement setup,
execution, analysis and
data management
Support custom test algorithms,
flexible test processes and
complex mathematical analysis with
customizable script programming platform
Wafer-Level
Electrical Parameter
Testing
Model Electrical
Characteristic Curve
Testing
Wafer Level
Reliability
Testing
Various
Mass Production
Testing