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Comprehensive Low-Frequency Measurement
By integrating leading semiconductor characteristic testing solutions with EDA products, we provide differentiated and higher value data-driven EDA full-process solutions through product collaboration.
Parametric Testing
The Parametric Testing system is a crucial tool for IC manufacturing and design optimization, enabling Foundry to evaluate and optimize the process, improve device performance, and ensure product stability and reliability. For IC design, parametric testing helps designers understand and verify device characteristics, evaluate design choices, and optimize circuit design.
Primarius FS-Pro parameter analyzer provides flexible and comprehensive device testing, allowing fast and accurate low-frequency characterization of almost all types of semiconductor devices. It is widely used in various research fields, including semiconductor devices, LED materials, two-dimensional materials devices, and new advanced materials testing, accelerating the development and evaluation of semiconductor devices and processes.
FS800 is a multi-functional device parameter analyzer, offering high precision IV testing, CV testing, fast waveform generation & measurement, low-frequency noise testing and high-speed time-domain signal acquisition with flexible configuration options. The built-in LabExpress? software has an intuitive GUI and a rich library of application tests, and supports customizable testing processes and algorithms. This instrument can be widely used in new material and device research, electrical parameter testing, device modeling, device reliability evaluation and similar applications.
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Semiconductor Parametric Analyzer
FS-Pro
All-In-One Semiconductor Parameter Analyzer
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Semiconductor Parametric Analyzer
FS800
Device Parameter Analyzer
Noise Measurement
Low-frequency noise testing is a crucial analytical tool in semiconductor device manufacturing and design. It is used to measure the 1/f noise and RTN noise performance of device, which helps Foundries, IDMs and fabless customers improve product quality and competitiveness. Foundries and IDMs can monitor and optimize process, while IC designers can evaluate and validate device noise characteristics to optimize circuit design for improved performance and reliability.
The Primarius 981X series low-frequency noise testing system is the gold standard in the low-frequency noise testing field. It is suitable for advanced process development, IC design, and academic research from mature processes to 28/14/10/5/3nm process nodes. Additionally, the 9812AC is the industry's first commercially available AC noise testing system which offers more possibilities for exploring new semiconductor research fields.
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Low Frequency Noise
9812DX
Low Frequency Noise Measurement System
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Low Frequency Noise
9812E
Compact Low Frequency Noise Measurement System
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Low Frequency Noise
9813DXC
Advanced Low Frequency Noise Measurement System
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AC Dynamic Noise
9812AC
AC Dynamic Noise Measurement System
Integrated Testing
LabExpress Electrical Parameter Testing Software is a GUI based professional tool designed for electrical parameter test applications across research, development and production of semiconductor devices, supporting efficient and coordinated control of diverse testing instruments, powerful data analysis and agile customization. Users can perform measurement tasks efficiently with rich ready-to-use test application library, and define custom test algorithms and processes for complex experiments. The software is also deeply optimized for automated measurement scenarios with capabilities of wafer mapping, massive data management. It comes with rich professional application testing features to improve the efficiency and user experience of automated testing and analysis.
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