Device Parameter Analyzer
Customizable and expandable IV, CV, low-frequency noise testing, and ultra-fast IV measurement capabilities to meet almost all testing requirements
Flexible modular architecture with the semiconductor characterization system mainframe and plug-in modules, providing a single-box solution for wafer-level automated testing
Support up to 24 SMUs or 132 channels switch matrix
Support multi-channel and multi-site parallel testing
The Built-in professional testing software LabExpress offers intuitive GUI interface with 18.5-inch touch screen, featuring rich ready-to-use library of application tests and powerful data analysis functionalities, while also supporting customizable algorithm, test flow and complex calculation
Wide test applications for semiconductor devices, LED materials, 2D materials, nano-materials, and novel devices
Wide bias range and high precision
High-speed sampling time-domain signal acquisition
Arbitrary linear waveform generation
A single-box solution that covers
all-around device parametric testing applications
IV, CV, transient IV sampling, high-speed
waveform generation & measurement
Supports installing up to 24 SMUs
or 132-channel switch matrix,
Supports hybrid architecture of
SMU and switch matrix
Supports automated testing of
wafer-level electrical parameters
in a single instrument
Supports parallel testing
Built-in LabExpress testing software
rich ready-to-use algorithm presets,
data analysis tools
and flexible customization
Process development
& device parameter testing
Semiconductor
device reliability
testing
Semiconductor
device ultrashort
pulse testing
Non-Volatile
Memory
Opto-electronic
device & MEMS measurement
2D materials
device testing
Metal material
testing
Advanced materials
and device testing