Flexible RF Modeling Platform
Easy to operate with powerful functions that supports various user-defined settings including RF characteristic testing, data de-embedding, characterization, parameter extraction, etc.
Various device testing templates enable efficient on-chip device IV/CV/RF characteristic testing, supporting up to 110GHz S-parameter measurement and parameter transformation
Built-in NanoSpice simulator engine allows for smooth conversion from baseband modeling cards to RF modeling cards, DC characteristics verification, RF model parameter extraction, model library generation
Multi-level model verification solutions covering RF data verification, model fitting & extraction verification, extensible model verification and model library verification, etc.
Automatic one-click generation of modeling/verification reports in Word, PPT, Excel, HTML, PDF and other formats based on customer requirements
Full capability from testing, characterization, parameter extraction to QA for I-V, S-parameters and NF50 thermal noise
Open API supporting data processing,
parameter extraction flow, model validation, and sub-circuit model topology customization, etc
RF modeling for
MOS, inductor, capacitor,
III-V devices (HEMT, HBT, etc.)
Windows, Linux and UNIX
operating systems
Built-in SPICE engine
for fast RF characterization and optimization
RF parameters &
Global model
RF device
small signal
testing
RF model
parameter extraction & optimization
RF model
development
for new devices
RF model
QA
verification